I&M Society Newsletter | IEEE Instrumentation & Measurement Society (ieee-ims.org)<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"

I&M Society Newsletter | IEEE Instrumentation & Measurement Society (ieee-ims.org)<\/p>\n","protected":false},"author":53,"featured_media":7719,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[65],"tags":[],"class_list":["post-7718","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-im-instrumentation-measurement-society"],"acf":[],"_links":{"self":[{"href":"https:\/\/ieee.li\/wp-json\/wp\/v2\/posts\/7718","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/ieee.li\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/ieee.li\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/ieee.li\/wp-json\/wp\/v2\/users\/53"}],"replies":[{"embeddable":true,"href":"https:\/\/ieee.li\/wp-json\/wp\/v2\/comments?post=7718"}],"version-history":[{"count":1,"href":"https:\/\/ieee.li\/wp-json\/wp\/v2\/posts\/7718\/revisions"}],"predecessor-version":[{"id":7720,"href":"https:\/\/ieee.li\/wp-json\/wp\/v2\/posts\/7718\/revisions\/7720"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/ieee.li\/wp-json\/wp\/v2\/media\/7719"}],"wp:attachment":[{"href":"https:\/\/ieee.li\/wp-json\/wp\/v2\/media?parent=7718"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/ieee.li\/wp-json\/wp\/v2\/categories?post=7718"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/ieee.li\/wp-json\/wp\/v2\/tags?post=7718"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}