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To read the IEEE-LI November Newsletter, click https:\/\/enotice.vtools.ieee.org\/public\/74537<\/p>\n","protected":false},"author":43,"featured_media":6711,"comment_status":"closed","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[14],"tags":[],"class_list":["post-6726","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-hot-topic"],"acf":[],"_links":{"self":[{"href":"https:\/\/ieee.li\/wp-json\/wp\/v2\/posts\/6726","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/ieee.li\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/ieee.li\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/ieee.li\/wp-json\/wp\/v2\/users\/43"}],"replies":[{"embeddable":true,"href":"https:\/\/ieee.li\/wp-json\/wp\/v2\/comments?post=6726"}],"version-history":[{"count":2,"href":"https:\/\/ieee.li\/wp-json\/wp\/v2\/posts\/6726\/revisions"}],"predecessor-version":[{"id":6728,"href":"https:\/\/ieee.li\/wp-json\/wp\/v2\/posts\/6726\/revisions\/6728"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/ieee.li\/wp-json\/wp\/v2\/media\/6711"}],"wp:attachment":[{"href":"https:\/\/ieee.li\/wp-json\/wp\/v2\/media?parent=6726"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/ieee.li\/wp-json\/wp\/v2\/categories?post=6726"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/ieee.li\/wp-json\/wp\/v2\/tags?post=6726"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}